S. Zimmermann et al., TEST STAND FOR THE SILICON VERTEX DETECTOR OF THE COLLIDER DETECTOR FACILITY, IEEE transactions on nuclear science, 43(3), 1996, pp. 1170-1174
A test stand for the next generation of the Silicon Vertex Detector (S
VX-II) of the Collider Detector Facility (CDF) at Fermilab has been de
veloped. It is capable of performing cosmic ray, beam, and laser pulsi
ng tests on silicon strip detectors using the new generation of SVX ch
ips. The test stand is composed of a SGI workstation. a VME CPU the Si
licon Test Acquisition and Readout (STAR) board, the Test Fiber Interf
ace Board (TFIB), and the Test Port Card (TPC). The STAR mediates betw
een external stimuli for the different tests and produces appropriate
high level commands which are sent to the TFIB. The TFIB, in conjuncti
on with the TPC, translates these commands into the correct logic leve
ls to control the SVX chips. The four modes of operation of the SVX ch
ips are configuration, data acquisition, digitization, and data readou
t. The data read out from the SVX chips is transferred to the STAR. Th
e STAR can then be accessed by the VME CPU and the SGI workstation for
future analyses. The detailed description of this test stand will be
given.