REAL-TIME SECONDARY-ELECTRON EMISSION DETECTOR FOR HIGH-RATE X-RAY CRYSTALLOGRAPHY

Authors
CHECHIK R BRESKIN A FRUMKIN I GABRIEL A KOCSIS M
Citation
R. Chechik et al., REAL-TIME SECONDARY-ELECTRON EMISSION DETECTOR FOR HIGH-RATE X-RAY CRYSTALLOGRAPHY, IEEE transactions on nuclear science, 43(3), 1996, pp. 1248-1252
Citations number
12
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
43
Issue
3
Year of publication
1996
Part
2
Pages
1248 - 1252
Database
ISI
SICI code
0018-9499(1996)43:3<1248:RSEDFH>2.0.ZU;2-6
Abstract
We present the first results of the application of a novel digital X-r ay imaging detector, based on secondary electron emission from a solid converter, to high-rate crystallographic studies. Results from diffra ction and small-angle scattering experiments from several crystallized proteins, performed at the European Synchrotron Radiation Facility, E SRF, Grenoble, are presented and compared with a phosphor-based imagin g system. Future developments of this detector system are proposed.