A METHOD TO IMPROVE SPECTRAL RESOLUTION IN PLANAR SEMICONDUCTOR GAMMA-RAY DETECTORS

Citation
Bd. Keele et al., A METHOD TO IMPROVE SPECTRAL RESOLUTION IN PLANAR SEMICONDUCTOR GAMMA-RAY DETECTORS, IEEE transactions on nuclear science, 43(3), 1996, pp. 1365-1368
Citations number
7
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
43
Issue
3
Year of publication
1996
Part
2
Pages
1365 - 1368
Database
ISI
SICI code
0018-9499(1996)43:3<1365:AMTISR>2.0.ZU;2-1
Abstract
This paper describes an empirically derived algorithm to compensate fo r charge trapping in CdTe, CdZnTe, and other planar semiconductor dete ctors. The method is demonstrated to be an improvement over available systems, and application to experimental data is shown.