PROGRESS IN MULTIELEMENT SILICON DETECTORS FOR SYNCHROTRON XRF APPLICATIONS

Citation
B. Ludewigt et al., PROGRESS IN MULTIELEMENT SILICON DETECTORS FOR SYNCHROTRON XRF APPLICATIONS, IEEE transactions on nuclear science, 43(3), 1996, pp. 1442-1445
Citations number
4
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
43
Issue
3
Year of publication
1996
Part
2
Pages
1442 - 1445
Database
ISI
SICI code
0018-9499(1996)43:3<1442:PIMSDF>2.0.ZU;2-Y
Abstract
Multi-element silicon strip detectors, in conjunction with integrated circuit pulse-processing electronics, offer an attractive alternative to conventional lithium-drifted silicon and high purity germanium dete ctors for high count rate, low noise synchrotron x-ray fluorescence ap plications. We have been developing these types of detectors specifica lly for low noise synchrotron applications, such as extended x-ray abs orption fine structure spectroscopy, microprobe x-ray fluorescence and total reflection x-ray fluorescence. The current version of the 192-e lement detector and integrated circuit preamplifier, cooled to -25 deg rees C with a single-stage thermoelectric cooler, achieves an energy r esolution of <200 eV full width of half maximum (FWHM) per channel (at 5.9 keV, 2 mu s peaking time), and each detector element is designed to handle similar to 20 Id-It count rate. The detector system will soo n be completed to 64 channels using new application specific integrate d circuit (ASIC) amplifier chips, new CAMAC (Computer Automated Measur ement and Control standard) analog-to-digital converters recently deve loped at Lawrence Berkeley National Laboratory (LBNL), CAMAC histogram ming modules, and Macintosh-based data acquisition software. We report on the characteristics of this detector system, and the work in progr ess towards the next generation system.