B. Ludewigt et al., PROGRESS IN MULTIELEMENT SILICON DETECTORS FOR SYNCHROTRON XRF APPLICATIONS, IEEE transactions on nuclear science, 43(3), 1996, pp. 1442-1445
Multi-element silicon strip detectors, in conjunction with integrated
circuit pulse-processing electronics, offer an attractive alternative
to conventional lithium-drifted silicon and high purity germanium dete
ctors for high count rate, low noise synchrotron x-ray fluorescence ap
plications. We have been developing these types of detectors specifica
lly for low noise synchrotron applications, such as extended x-ray abs
orption fine structure spectroscopy, microprobe x-ray fluorescence and
total reflection x-ray fluorescence. The current version of the 192-e
lement detector and integrated circuit preamplifier, cooled to -25 deg
rees C with a single-stage thermoelectric cooler, achieves an energy r
esolution of <200 eV full width of half maximum (FWHM) per channel (at
5.9 keV, 2 mu s peaking time), and each detector element is designed
to handle similar to 20 Id-It count rate. The detector system will soo
n be completed to 64 channels using new application specific integrate
d circuit (ASIC) amplifier chips, new CAMAC (Computer Automated Measur
ement and Control standard) analog-to-digital converters recently deve
loped at Lawrence Berkeley National Laboratory (LBNL), CAMAC histogram
ming modules, and Macintosh-based data acquisition software. We report
on the characteristics of this detector system, and the work in progr
ess towards the next generation system.