ITA
ENG

CMOS CHARGED-PARTICLE SPECTROMETERS

Authors

SOLI GA GARRETT HB FOSSUM ER

Citation

Ga. Soli et al., CMOS CHARGED-PARTICLE SPECTROMETERS, IEEE transactions on nuclear science, 43(3), 1996, pp. 1516-1520

Citations number

Categorie Soggetti

Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic

Journal title

IEEE transactions on nuclear science → ACNP

ISSN journal

00189499

Volume

Issue

Year of publication

1996

Part

Pages

1516 - 1520

Database

ISI

SICI code

0018-9499(1996)43:3<1516:CCS>2.0.ZU;2-R

Abstract

Integrated circuits, manufactured in CMOS technology, have been develo ped as diffusion-based charged particle spectrometers for space applic ations. Current designs are single-chip spectrometers capable of uniqu ely identifying and counting electrons and heavy ions. A four-chip spe ctrometer designed to count protons and heavy ions was flown on the Cl ementine spacecraft. The spectrometer proton data is compared to GOES- 6 proton data for the 21 February 1994 solar proton event.