The in-plane thermal conductivity of thin polycrystalline diamond film
s produced in a d.c. discharge system has been measured by a contactle
ss technique of transient thermal grating. Diamond films of different
qualities but of the same thickness (11 mu m) were deposited from CH4/
H-2 mixtures at methane contents ranging from 2% to 10%. The highest t
hermal conductivity k=9.5 W cm(-1) K-1 was found for the sample synthe
sized at the lowest CH4 concentration (2%), the value of k smoothly de
creasing to 1.2 W cm(-1) K-1 with increasing methane content. The obta
ined results are in good agreement with previous measurements on simil
ar films performed by the mirage technique. A correlation of thermal c
onductivity with film morphology and phase content analyzed by SEM and
Raman spectroscopy is discussed.