PHOTOACOUSTIC THERMAL CHARACTERIZATION OF SPARK-PROCESSED POROUS SILICON

Citation
A. Cruzorea et al., PHOTOACOUSTIC THERMAL CHARACTERIZATION OF SPARK-PROCESSED POROUS SILICON, Journal of applied physics, 79(12), 1996, pp. 8951-8954
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
12
Year of publication
1996
Pages
8951 - 8954
Database
ISI
SICI code
0021-8979(1996)79:12<8951:PTCOSP>2.0.ZU;2-#
Abstract
A non-separation approach to determine the spark-processed porous sili con thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in comb ination with compositional models for spark-processed porous silicon s amples, The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens t he possibility of performing the thermal characterization of other por ous semiconductors and analogous materials. (C) 1996 American Institut e of Physics.