A non-separation approach to determine the spark-processed porous sili
con thermal parameters is presented. This thermal characterization was
performed through application of the photoacoustic technique, in comb
ination with compositional models for spark-processed porous silicon s
amples, The thermal parameters obtained are in agreement with existing
studies about the composition of this material. This approach opens t
he possibility of performing the thermal characterization of other por
ous semiconductors and analogous materials. (C) 1996 American Institut
e of Physics.