POSITRON LIFETIME MEASUREMENTS ON NEUTRON-IRRADIATED INP CRYSTALS

Citation
Fj. Navarro et al., POSITRON LIFETIME MEASUREMENTS ON NEUTRON-IRRADIATED INP CRYSTALS, Journal of applied physics, 79(12), 1996, pp. 9043-9046
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
12
Year of publication
1996
Pages
9043 - 9046
Database
ISI
SICI code
0021-8979(1996)79:12<9043:PLMONI>2.0.ZU;2-9
Abstract
Neutron-irradiated InP single crystals have been investigated by posit ron-lifetime measurements. The samples were irradiated with thermal ne utrons at different fluences yielding concentrations for Sn-transmuted atoms between 2X10(15) and 2X10(18) cm(-3). The lifetime spectra have been analyzed into one exponential decay component. The mean lifetime s show a monotonous increase with the irradiation dose from 246 to 282 ps. The increase in the lifetime has been associated to a defect cont aining an Indium vacancy. Thermal annealing at 550 degrees C reduces t he lifetime until values closed to those obtained for the as-grown and conventionally doped InP crystals. (C) 1996 American Institute of Phy sics.