E. Muller et al., SIMULTANEOUS DETERMINATION OF THE CONSTITUENTS IN AL-GE-SI ALLOYS BY INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY, Fresenius' journal of analytical chemistry, 355(3-4), 1996, pp. 267-268
An accurate method for determination of the constituents Ge, Si, In an
d Mg in Al-Ge-Si based compact alloys and foil materials by ICP atomic
emission spectrometry is developed. The material samples were dissolv
ed in nitric acid-hydrofluoric acid. Optimum parameters for the simult
aneous measurement of the constituent elements are worked out. To comp
ensate the time determined sensitivity fluctuations the analytical sig
nal was corrected by a special procedure of external standardization.