D. Nicolaescu et al., MODELING OF THE FIELD-EMISSION MICROTRIODE WITH EMITTER COVERED WITH POROUS SILICON, Applied surface science, 94-5, 1996, pp. 79-86
Citations number
17
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Electron field emission is obtained using high enough (greater than or
equal to 1 V/nm) electric fields. Such local fields are usually obtai
ned using sharp emitters. An alternative approach is to cover the othe
rwise blunt emitter (BE) with a porous silicon (PS) layer. The PS is c
omposed of many fibrils with dimensions of several nm which act as ''n
ano-emitters''. In this article such an emitter is considered as part
of a vertical field emission microtriode (FEMT). The BE has spherical
tip and conical body and protrudes through the gate circular opening,
allowing the FEMT operation in the collector-assisted mode. An electri
c field multiplication approximation is studied using both an analytic
al and a numerical emitter model. The field multiplication means that
the fibril increases the local electric field, which is already increa
sed by the BE as compared with the uniform field at large distances fr
om it. This approximation is valid as long as the fibril dimensions ar
e much smaller than the BE ones. The fibrils mutual influence on the f
ield is studied separately and taken into account for the FEMT case. T
he emission current is computed through integration of the Fowler-Nord
heim J(E) current density-electric field relationship over the BE and
fibrils area. Comparison is provided with the case of BE not covered w
ith PS. The emission current is obtained as function of model paramete
rs. FEMT modelling results include transconductance, capacitance, cut-
off frequency and static gain, Reference to experimental results is pr
ovided.