S. Duval et al., CONTRIBUTION OF 3D ATOM-PROBE TO THE UNDERSTANDING OF PLANE-BY-PLANE AP ANALYSES DATA - APPLICATION TO THE STUDY OF ORDERING IN CU3AU, Applied surface science, 94-5, 1996, pp. 449-456
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
3D atom probes such as the tomographic atom probe, make it is possible
to perform plane-by-plane analyses with a very large field of view. A
s in the case of the conventional atom probe, these analyses are subje
cted to a number of possible artefacts such as preferential retention
or evaporation of species, or pile-up effects. However, taking advanta
ge of the use of a position-sensitive detector, it is possible to stud
y where these artefacts preferentially occur within the area of analys
is. Then, experimental conditions can be selected in order to minimise
the spatial extent of these artefacts. We have developed new programs
in order to get a better understanding of the field evaporation behav
iour of planes. We have shown that it is possible to considerably mini
mise artefacts by carefully setting the tip temperature, These results
have been applied to the study of ordering phenomena in Cu3Au with th
e tomographic atom probe.