Opm. Pekonen et al., RIGOROUS ANALYSIS OF CIRCUIT PARAMETER EXTRACTION FROM AN FDTD SIMULATION EXCITED WITH A RESISTIVE VOLTAGE-SOURCE, Microwave and optical technology letters, 12(4), 1996, pp. 205-210
FDTD simulations excited with a resistive voltage source are under stu
dy in this article. Focus is on the parasitic capacitance of the excit
ation. It is shown that the resistance of the excitation is actually a
frequency-dependent impedance. Because the resistive voltage source o
perates as a current source, errors are generated to the generator vol
tage of the excitation and, furthermore, to the extracted circuit para
meters. Effective methods are presented to overcome this problem. (C)
1996 John Wiley & Sons, Inc.