ANALYSIS OF THIN COPPER FILM PLANAR LINES WITH FRACTAL STRUCTURE FOR MICROWAVE CIRCUITS

We propose modifying the spectral-domain approach to analyze planar li nes with a very thin copper strip, presenting a fractal character. We derive, from a fractional derivative electromagnetism formulation, a n ew modified surface impedance introduced in that numerical technique. The results exhibit very sensitive evolution of the losses and of the relative effective permittivity versus frequency. (C) 1996 John Wiley & Sons, Inc.