P. Lepage et P. Pribetich, ANALYSIS OF THIN COPPER FILM PLANAR LINES WITH FRACTAL STRUCTURE FOR MICROWAVE CIRCUITS, Microwave and optical technology letters, 12(4), 1996, pp. 221-224
We propose modifying the spectral-domain approach to analyze planar li
nes with a very thin copper strip, presenting a fractal character. We
derive, from a fractional derivative electromagnetism formulation, a n
ew modified surface impedance introduced in that numerical technique.
The results exhibit very sensitive evolution of the losses and of the
relative effective permittivity versus frequency. (C) 1996 John Wiley
& Sons, Inc.