X-RAY PHOTOEMISSION ELECTRON-MICROSCOPY - MAGNETIC CIRCULAR-DICHROISMIMAGING AND OTHER CONTRAST MECHANISMS

The x-ray photoemission electron microscope (X-PEEM) is a type of spec tromicroscope, which can make spatial maps of chemical composition. Th e contrast in the images can originate from a number of properties of the sample, and by controlling the way the XPEEM is used a number of d ifferent types of information about the surface can be revealed. These contrast mechanisms include topography, band-gap, work function, chem ical composition, crystalline orientation, adsorbate reactants, and ma gnetic domains. Some recent results are described.