K. Seki et al., ELECTRONIC-STRUCTURES OF POLYSILANES AND RELATED-COMPOUNDS, Journal of electron spectroscopy and related phenomena, 78, 1996, pp. 403-406
UPS and Si K- and L(II,III)-edge NEXAPS spectra of various polysilanes
, poly(dimethylsiloxane), and octakis(t-butyl)octa-silacubane (OTBOSC)
were measured for elucidating their occupied and vacant electronic st
ructures, in comparison with the results for polysilazane. The results
revealed that the electronic structures are sensitive for the main ch
ain structure, pendant, and the dimensionality of the Si-containing ba
ckbone.