PROGRESS IN UNDERSTANDING VUV PHOTOEMISSION IN LOW-DIMENSIONALITY SYSTEMS

Citation
H. Berger et al., PROGRESS IN UNDERSTANDING VUV PHOTOEMISSION IN LOW-DIMENSIONALITY SYSTEMS, Journal of electron spectroscopy and related phenomena, 78, 1996, pp. 431-436
Citations number
20
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
78
Year of publication
1996
Pages
431 - 436
Database
ISI
SICI code
0368-2048(1996)78:<431:PIUVPI>2.0.ZU;2-5
Abstract
High-resolution angle-resolved photoemission and core-level photoemiss ion measurements were performed on single crystal samples of the quasi -one-dimensional material (TaSe4)(2)I and the cuprate superconductor B i2Sr2CaCu2O8+x. Resistivity measurements were performed on both materi als. X-ray diffraction, transmission electron microscopy (TEM), and AC susceptibility measurements were performed on the cuprate samples. Th e data indicate that photoemission studies provide key information in understanding the physics issues of both materials.