Dsy. Hsu et Hf. Gray, VERTICAL THIN-FILM-EDGE FIELD EMITTERS - FABRICATION BY CHEMICAL BEAMDEPOSITION, IMAGING OF CATHODOLUMINESCENCE AND CHARACTERIZATION OF EMISSION, Thin solid films, 286(1-2), 1996, pp. 92-97
We report the first fabrication of ungated vertical thin-film-edge fie
ld emitters using chemical beam deposition techniques, and the first m
easurement of field electron emission from arrays of such emitters. Th
e deposition method has been shown to result in optimal material and s
tructural film properties which are required for low voltage operation
of thin-film-edge field emitters. These characteristics include an ex
tremely small grain size, low stress, high purity, uniform thickness a
nd a vertical geometry. We have imaged well-resolved emission patterns
by cathodoluminescence using the field-emitted electrons, and have me
asured well-behaved Fowler-Nordheim current-voltage characteristics. O
ther advantages, such as robustness and inexpensive manufacturing, are
also discussed.