The effect of halide ions on the formation and dissolution behaviour o
f zirconium oxide was studied using galvanostatic and capacitance tech
niques. Increase of F- ion concentration and temperature restrict the
oxide film growth and increase the average rate of dissolution of zirc
onium oxide. The Cl- ion causes a localized attack on zirconium during
oxide formation and dissolves the oxide to some extent. The Br- ion h
as an appreciable attack on the oxide film formation and dissolution,
while I- ion has a very low effect on both the formation and dissoluti
on process of zirconium oxide. Oxide film formed at a high formation v
oltage was found to be more defective than that formed at a lower one.