RELAXATION PROCESS OF THE SELF-TRAPPING EXCITON IN C-60

Citation
X. Sun et al., RELAXATION PROCESS OF THE SELF-TRAPPING EXCITON IN C-60, Physical review. B, Condensed matter, 53(23), 1996, pp. 15481-15484
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
23
Year of publication
1996
Pages
15481 - 15484
Database
ISI
SICI code
0163-1829(1996)53:23<15481:RPOTSE>2.0.ZU;2-0
Abstract
When C-60 is photoexcited, a self-trapping exciton (STE) is formed: Th e bond structure is distorted from symmetry I-h to D-5d while the stat es A(1u) and A(2u) are pulled into the energy gap from highest occupie d molecular orbital and lowest unoccupied molecular orbital, respectiv ely. A dynamical scheme is employed to simulate the relaxation process of STE. The evolution of both bond structure and electronic states sh ows that the relaxation time to form STE is about 100 fs. It should be noted that this relaxation time is much shorter than that of charge t ransfer in C-60. The origin for this large difference is discussed.