CONDUCTANCE STEP FOR A SINGLE-ATOM CONTACT IN THE SCANNING TUNNELING MICROSCOPE - NOBLE AND TRANSITION-METALS

Citation
C. Sirvent et al., CONDUCTANCE STEP FOR A SINGLE-ATOM CONTACT IN THE SCANNING TUNNELING MICROSCOPE - NOBLE AND TRANSITION-METALS, Physical review. B, Condensed matter, 53(23), 1996, pp. 16086-16090
Citations number
25
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
23
Year of publication
1996
Pages
16086 - 16090
Database
ISI
SICI code
0163-1829(1996)53:23<16086:CSFASC>2.0.ZU;2-0
Abstract
Conductance steps for atomic point contacts of An, Ni, and Pt have bee n measured. Jump-to-contact and jump-to-tunnel processes have been ide ntified and their conductances measured. Differences between conductan ce steps for noble and transition metals are interpreted as being due to the d orbitals that, in transition metals, provide new channels to the electron conductance. This interpretation is supported by a theore tical analysis, which shows good agreement with the experimental data.