ENHANCEMENT OF DIAMOND THIN-FILM QUALITY BY A CYCLIC DEPOSITION METHOD UNDER MPECVD

Citation
Ys. Park et al., ENHANCEMENT OF DIAMOND THIN-FILM QUALITY BY A CYCLIC DEPOSITION METHOD UNDER MPECVD, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 209(1-2), 1996, pp. 414-419
Citations number
8
Categorie Soggetti
Material Science
ISSN journal
09215093
Volume
209
Issue
1-2
Year of publication
1996
Pages
414 - 419
Database
ISI
SICI code
0921-5093(1996)209:1-2<414:EODTQB>2.0.ZU;2-C
Abstract
Diamond thin films were deposited by a cyclic deposition method, which can be carried out periodically on and off the methane gas flow in th e CH4-H-2 system, using a microwave plasma enhanced chemical vapour de position system. The property of diamond thin films deposited using th e cyclic process was investigated and compared with that of the normal process. The quality of the diamond films deposited by the cyclic pro cess is better than that by the normal process under the same conditio ns, although the growth rate of diamond film was lower in the cyclic p rocess. However, introducing the interlayer on silicon substrate prior to the cyclic process leads to the increase in the growth rate which is comparable with that in the normal process while maintaining the sa me high quality of the films.