G. Dumpich et al., ELECTRON LOCALIZATION IN GRANULAR-MATERIALS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 217, 1996, pp. 353-357
We have investigated the structural and electrical properties of granu
lar Pd/C as well as granular Au/C thin films. As revealed by transmiss
ion electron microscopy the films consist of small metallic clusters o
f either Pd or Au embedded within amorphous carbon. Films with low met
al volume fraction, x consist of structurally isolated clusters and sh
ow exponential resistance behavior. Above the so-called percolation th
reshold x(p), metallic clusters form a percolating network rendering m
etallic conductivity. For metallic films with x much greater than x(p)
we observe two dimensional (2d) electronic transport behavior at low
temperatures via small additional contributions to the Boltzmann-resis
tance as arising from weak electron localization (WEL) and enhanced el
ectron-electron interaction (EEI). When approaching the percolation th
reshold these additional resistance contributions grow in absolute mag
nitude and the 2d transport behavior changes to 3d-behavior close to x
(p). For both cases resistance as well as magnetoresistance data can b
e well explained using theories for WEL and EEI in 2d and 3d respectiv
ely.