TRANSIENT LASER-INDUCED GRATING SPECTROSCOPY IN POROUS SILICON

Authors
TOMASIUNAS R PELANT I HOSPODKOVA A KOHLOVA V KNAPEK P LEVY R MONIATTE J GRUN JB HONERLAGE B
Citation
R. Tomasiunas et al., TRANSIENT LASER-INDUCED GRATING SPECTROSCOPY IN POROUS SILICON, Thin solid films, 276(1-2), 1996, pp. 55-57
Citations number
11
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
276
Issue
1-2
Year of publication
1996
Pages
55 - 57
Database
ISI
SICI code
0040-6090(1996)276:1-2<55:TLGSIP>2.0.ZU;2-K
Abstract
The authors report on the first experimental observation of transient laser-induced gratings in self-supporting porous silicon membranes wit h different porosities. The observed grating decay in time is very fas t (hundreds of picoseconds) at room temperature and shortens both with decreasing porosity and grating period. A preliminary microscopic mod el for this behaviour is suggested, The third-order non-linear optical susceptibility chi((3)) (532 nm) in porous Si was found to be chi((3) ) approximate to 7 x 10(-11) e.s.u.