Vy. Timoshenko et al., STABLE AND EFFICIENT CATHODOLUMINESCENCE AND PHOTOLUMINESCENCE FROM ULTRATHIN POROUS SILICON LAYERS, Thin solid films, 276(1-2), 1996, pp. 287-289
Ultrathin porous Si layers (UPSLs) prepared on n-Si in aqueous NH4F so
lution and oxidized in air were investigated with cathode- (CL), photo
- (PL) and electroluminescence (EL) and have been compared with conven
tionally prepared thick per-Si layers. The nanoporous structures were
controlled with high-resolution scanning electron microscopy. Infrared
spectroscopy was used for native oxide analysis. The luminescence pro
perties of UPSLs were characterized by unusual high stability while co
nventionally prepared per-Si showed strong luminescence degradation. T
he CL spectra of UPSLs showed three peaks at 300, 400 and 560 nm and a
shoulder about 620 nm. The PL and EL spectra of UPSLs were peaked at
620 and 800 nm, respectively. The role of native oxide formation for s
table per-Si luminescence is discussed.