RBS ION IMPLANTER FACILITY FOR IN-SITU ION-SURFACE STUDIES/

Citation
Js. Colligon et al., RBS ION IMPLANTER FACILITY FOR IN-SITU ION-SURFACE STUDIES/, Radiation effects and defects in solids, 138(3-4), 1996, pp. 195-202
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Nuclear Sciences & Tecnology
ISSN journal
10420150
Volume
138
Issue
3-4
Year of publication
1996
Pages
195 - 202
Database
ISI
SICI code
1042-0150(1996)138:3-4<195:RIIFFI>2.0.ZU;2-P
Abstract
An RBS/ion implanter facility for high-energy ion-surface interaction studies was constructed. The potential application of the facility was demonstrated by studying ion-stimulated processes in Ni films on an A l substrate at elevated temperatures and preferential sputtering of Ni 4Mo single crystals. An unusual temperature behaviour for the radiatio n enhanced diffusion rate in the vicinity of the Curie point for Ni wa s seen. The sputtering of (001) and (111) faces of Ni4Mo single crysta l with 20-80 keV inert gas ions was shown to enrich the surface in Mo, which is the same for both faces.