CHARACTERIZATION OF AMORPHOUS-CARBON COATED SILICON FIELD EMITTERS

Citation
Af. Myers et al., CHARACTERIZATION OF AMORPHOUS-CARBON COATED SILICON FIELD EMITTERS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2024-2029
Citations number
27
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
3
Year of publication
1996
Pages
2024 - 2029
Database
ISI
SICI code
1071-1023(1996)14:3<2024:COACSF>2.0.ZU;2-#
Abstract
Amorphous carbon was deposited on needle-shaped Si field emitters by f iltered cathodic are. Electron emission was obtained from these coated cathodes, but was reduced compared to emission from uncoated Si catho des. Electron energy loss spectroscopy indicated that the coating was a high sp(2) content amorphous carbon. Au particles were found to have precipitated out of the Si emitters, which were grown by a vapor-liqu id-solid technique utilizing the Au-Si eutectic during the oxidation a nd chemical etch sharpening of the emitters. High resolution transmiss ion electron microscopy and selected area electron diffraction confirm ed the amorphous nature of the coating and the presence of the Au part icles at the Si surface. The field emission, electron energy loss spec troscopy, high resolution transmission electron microscopy, and select ed area electron diffraction results are presented and discussed. (C) 1996 American Vacuum Society.