Af. Myers et al., CHARACTERIZATION OF AMORPHOUS-CARBON COATED SILICON FIELD EMITTERS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2024-2029
Amorphous carbon was deposited on needle-shaped Si field emitters by f
iltered cathodic are. Electron emission was obtained from these coated
cathodes, but was reduced compared to emission from uncoated Si catho
des. Electron energy loss spectroscopy indicated that the coating was
a high sp(2) content amorphous carbon. Au particles were found to have
precipitated out of the Si emitters, which were grown by a vapor-liqu
id-solid technique utilizing the Au-Si eutectic during the oxidation a
nd chemical etch sharpening of the emitters. High resolution transmiss
ion electron microscopy and selected area electron diffraction confirm
ed the amorphous nature of the coating and the presence of the Au part
icles at the Si surface. The field emission, electron energy loss spec
troscopy, high resolution transmission electron microscopy, and select
ed area electron diffraction results are presented and discussed. (C)
1996 American Vacuum Society.