I. Takeuchi et al., FABRICATION OF INPLANE ALIGNED A-AXIS ORIENTED YBA2CU3O7-X TRILAYER JOSEPHSON-JUNCTIONS, Applied physics letters, 69(1), 1996, pp. 112-114
We have fabricated vertical a2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x(YBCO/PB
CO/YBCO) Josephson junctions using in-plane aligned a-axis oriented YB
CO multilayers on (100) LaSrGaO4(LSGO). The T-c's of the device electr
odes are typically greater than 80 K. Josephson coupling is observed f
or barrier thickness up to 800 Angstrom. Strong nonlinear I-V characte
ristics arising from the properties of PBCO are observed for thicker b
arrier devices. Chip to chip spread in the device characteristics may
be intrinsically due to the PBCO barrier. (C) 1996 American Institute
of Physics.