Dp. Yao et al., AN EXPERIMENTAL-TECHNIQUE FOR STUDYING MIXED-MODE FATIGUE-CRACK GROWTH IN SOLDER JOINTS, Journal of electronic packaging, 118(2), 1996, pp. 45-48
Failures of solder joints often result from development of cracks unde
r complex mixed-mode loading conditions. In this study, a flexural pee
l technique was developed to investigate the growth of cracks at the i
nterface between solder and Cu substrate. The technique was based on a
tri-layer solder/Cu joints, with the solder layer sandwiched between
two Cu layers of desired thicknesses. Finite element analysis was used
to calculate the mixed-mode condition at the crack tip as a function
of the thicknesses of Cu outerlayers and the solder interlayer. The ap
plication of this technique to studying interface crack growth under f
atigue loading is demonstrated for eutectic solder joints.