UNDERLAYER THICKNESS DEPENDENCE OF MAGNETIC-PROPERTIES OF CO83CR17 CO96ZR4 DOUBLE-LAYER BY FTS SYSTEM/

Authors
YU SC BAEK JS NAKAGAWA S NAOE M
Citation
Sc. Yu et al., UNDERLAYER THICKNESS DEPENDENCE OF MAGNETIC-PROPERTIES OF CO83CR17 CO96ZR4 DOUBLE-LAYER BY FTS SYSTEM/, Journal of magnetism and magnetic materials, 155(1-3), 1996, pp. 225-227
Citations number
13
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
155
Issue
1-3
Year of publication
1996
Pages
225 - 227
Database
ISI
SICI code
0304-8853(1996)155:1-3<225:UTDOMO>2.0.ZU;2-8
Abstract
The two step sputtering method with facing targets sputtering (FTS) sy stem was employed in continuously depositing Co83Cr17 layer with good c-axis orientation, large saturation magnetization and remarkable perp endicular magnetic anisotropy on a very thin underlayer of amorphous C o96Zr4 on slide glass substrate. The optimum thickness of the amorphou s Co96Zr4 underlayer was about 400 Angstrom for improving perpendicula r magnetic anisotropy of 4000 Angstrom thick Co83Cr17 layer.