ANALYTICAL DESCRIPTION OF THE FILM THICKNESS DISTRIBUTION OBTAINED BYTHE PULSED-LASER ABLATION OF A MONOATOMIC TARGET - APPLICATION TO SILICON AND GERMANIUM

Citation
F. Antoni et al., ANALYTICAL DESCRIPTION OF THE FILM THICKNESS DISTRIBUTION OBTAINED BYTHE PULSED-LASER ABLATION OF A MONOATOMIC TARGET - APPLICATION TO SILICON AND GERMANIUM, Applied surface science, 96-8, 1996, pp. 50-54
Citations number
10
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
96-8
Year of publication
1996
Pages
50 - 54
Database
ISI
SICI code
0169-4332(1996)96-8:<50:ADOTFT>2.0.ZU;2-1
Abstract
In this work, the spatial distribution of laser-generated species in v acuum from a monoatomic target is deduced from the analytical resoluti on of the hydrodynamic equations for a plasma expanding in the adiabat ic regime. The thickness distribution of the laser deposited layers is demonstrated to be related to the initial dimensions of the plasma bu t independent of both the laser fluence and the atomic mass of the tar get element. From these calculations, we also deduced an angular distr ibution of the deposits as a sum of cos(n) theta. These theoretical re sults are experimentally supported in the specific case of the pulsed excimer laser ablation of Si and Ge monoatomic targets.