ANALYTICAL DESCRIPTION OF THE FILM THICKNESS DISTRIBUTION OBTAINED BYTHE PULSED-LASER ABLATION OF A MONOATOMIC TARGET - APPLICATION TO SILICON AND GERMANIUM
F. Antoni et al., ANALYTICAL DESCRIPTION OF THE FILM THICKNESS DISTRIBUTION OBTAINED BYTHE PULSED-LASER ABLATION OF A MONOATOMIC TARGET - APPLICATION TO SILICON AND GERMANIUM, Applied surface science, 96-8, 1996, pp. 50-54
Citations number
10
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
In this work, the spatial distribution of laser-generated species in v
acuum from a monoatomic target is deduced from the analytical resoluti
on of the hydrodynamic equations for a plasma expanding in the adiabat
ic regime. The thickness distribution of the laser deposited layers is
demonstrated to be related to the initial dimensions of the plasma bu
t independent of both the laser fluence and the atomic mass of the tar
get element. From these calculations, we also deduced an angular distr
ibution of the deposits as a sum of cos(n) theta. These theoretical re
sults are experimentally supported in the specific case of the pulsed
excimer laser ablation of Si and Ge monoatomic targets.