An orientational dependence of the resistivity and critical current de
nsity was observed in c-axis oriented Bi2Sr2CaCu2O8+delta films grown
on MgO substrates by pulsed-laser deposition. As derived from X-ray di
ffraction and scanning electron microscopy, the anisotropy is caused b
y the small tilt angle of the c-axis with respect to the substrate sur
face.