Rare-earth (Er,Yb) doped glass films are prepared by pulsed laser depo
sition onto different substrates: Si, fused quartz and Si with a silic
on oxide buffer layer. Films grown in the presence of an oxygen pressu
re higher than 6 x 10(-2) mbar have a refractive index close and sligh
tly higher than that of the bulk material thus proving that the densit
y of the films is high. Films thicker than 1 mu m are multimode wavegu
ides with a refractive index of 1.562 +/- 0.003 and show losses higher
than 10 dB/cm which seem to be related to surface roughness due both
to the substrate quality and the deposition process.