Authors
Citation
Mjm. Gomes et al., GROWTH AND CHARACTERIZATION OF PLZT FILMS, Applied surface science, 96-8, 1996, pp. 779-783
Citations number
22
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
96-8
Year of publication
1996
Pages
779 - 783
Database
ISI
SICI code
0169-4332(1996)96-8:<779:GACOPF>2.0.ZU;2-G
Abstract
A series of experiments on the growth of PLZT thin films, using pulsed
laser ablation have been performed. Polycrystalline films were deposi
ted onto glass slides at room temperature, using a Nd:YAG laser, and t
heir structure was analysed using X-ray diffraction. The degree of cry
stallinity and the structure present in the films is correlated with t
he deposition conditions.