The growth, by pulsed laser deposition (PLD), and characterisation of
thin films of Ce0.9Gd0.1O1.95 (CGO), La0.7Sr0.3CoOy and La0.7Sr0.3Co0.
2Fe0.8Oy, for solid oxide fuel cell (SOFC) application has been invest
igated. The structural quality and chemical composition was evaluated
using X-ray diffraction and secondary ion mass spectrometry. Energy-di
spersive mass spectrometry was also used as a method of characterising
the ablated plume and gas phase species. During the ablation of CGO,
significant numbers of molecular ions of Ce-O+ and Gd-O+ were observed
in the plume, even in vacuum, The presence of these species suggests
that the background gas pressure required, during deposition, to maint
ain stoichiometry is required to enhance the sticking coefficient of C
ef on the surface. The effects of deposition parameters on the angular
distribution of material has also been investigated using a quartz cr
ystal microbalance.