Qy. Chen et al., MICROSTRUCTURAL OBSERVATION OF ORGANIC THIN-FILM IN OPTICAL-RECORDING, Materials science & engineering. B, Solid-state materials for advanced technology, 39(2), 1996, pp. 101-105
The microstructure of recorded organic thin film in optical recording
is observed using several methods, ie. optical microscopy (OM), scanni
ng electron microscopy (SEM) and scanning tunneling microscopy (STM).
From the microarea morphology images, it is found that bubbles are pro
duced after laser irradiation of phthalocyanine film. The comparison b
etween these methods indicates that STM can provide detailed three dim
ensional parameters of the film adding to what can be obtained from OM
and SEM. The investigation on the micostructure of thin film has been
proved to be an important aid to analyze the disk performance.