MICROSTRUCTURAL OBSERVATION OF ORGANIC THIN-FILM IN OPTICAL-RECORDING

Authors
Citation
Qy. Chen et al., MICROSTRUCTURAL OBSERVATION OF ORGANIC THIN-FILM IN OPTICAL-RECORDING, Materials science & engineering. B, Solid-state materials for advanced technology, 39(2), 1996, pp. 101-105
Citations number
18
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
09215107
Volume
39
Issue
2
Year of publication
1996
Pages
101 - 105
Database
ISI
SICI code
0921-5107(1996)39:2<101:MOOOTI>2.0.ZU;2-U
Abstract
The microstructure of recorded organic thin film in optical recording is observed using several methods, ie. optical microscopy (OM), scanni ng electron microscopy (SEM) and scanning tunneling microscopy (STM). From the microarea morphology images, it is found that bubbles are pro duced after laser irradiation of phthalocyanine film. The comparison b etween these methods indicates that STM can provide detailed three dim ensional parameters of the film adding to what can be obtained from OM and SEM. The investigation on the micostructure of thin film has been proved to be an important aid to analyze the disk performance.