ENERGY STRAGGLING AND MULTIPLE-SCATTERING IN SILICON STRIP DETECTORS

Authors
ANTICIC T BATTISTON R BRAUNSCHWEIG W CHANG YH CHIEN CY CHEN AE HOU SR LIN CH LIN WT OSTONEN R SPARTIOTIS K SYBEN O TOKER O WITTMER B
Citation
T. Anticic et al., ENERGY STRAGGLING AND MULTIPLE-SCATTERING IN SILICON STRIP DETECTORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 374(3), 1996, pp. 309-314
Citations number
23
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
374
Issue
3
Year of publication
1996
Pages
309 - 314
Database
ISI
SICI code
0168-9002(1996)374:3<309:ESAMIS>2.0.ZU;2-V
Abstract
We present a test beam study of energy straggling and multiple scatter ing in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scattering in crystalline structure was investigated by p lacing a GaAs wafer at various angles.