MEASUREMENT OF L-X-RAY-INTENSITY RATIOS IN TANTALUM BY PROTON AND SI-ION IMPACT

Citation
Js. Braich et al., MEASUREMENT OF L-X-RAY-INTENSITY RATIOS IN TANTALUM BY PROTON AND SI-ION IMPACT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 111(1-2), 1996, pp. 22-26
Citations number
14
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
111
Issue
1-2
Year of publication
1996
Pages
22 - 26
Database
ISI
SICI code
0168-583X(1996)111:1-2<22:MOLRIT>2.0.ZU;2-S
Abstract
The L iota, L beta(1,4,6), L beta(2,15,3), L gamma(1), L gamma(2,3,6) and L gamma(4,4), X-ray intensities relative to the L alpha, caused by the impact of protons of energy 1 to 4.6 MeV and Si-ions of 70 to 98 MeV on Ta targets, have been measured, The results show that the inten sity ratios drop significantly for all transitions except L gamma(2,3, 6)/L alpha with Si-ions of the same energy/amu as compared to those of protons. The experimental results have been compared with those based on the ECPSSR theoretical values. From the energy shift and change in the intensity ratios of various transitions caused by Si-ion impact, the number of outer shell vacancies in the M, N and O-shells simultane ous to that of L-shell have been estimated.