ETCH RATES FOR MICROMACHINING PROCESSING

Citation
Kr. Williams et Rs. Muller, ETCH RATES FOR MICROMACHINING PROCESSING, Journal of microelectromechanical systems, 5(4), 1996, pp. 256-269
Citations number
71
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
10577157
Volume
5
Issue
4
Year of publication
1996
Pages
256 - 269
Database
ISI
SICI code
1057-7157(1996)5:4<256:ERFMP>2.0.ZU;2-#
Abstract
The etch rates for 317 combinations of 16 materials (single-crystal si licon, doped, and undoped polysilicon, several types of silicon dioxid e, stoichiometric and silicon-rich silicon nitride, aluminum, tungsten , titanium, Ti/W alloy, and two brands of positive photoresist) used i n the fabrication of microelectromechanical systems and integrated cir cuits in 28 wet, plasma, and plasmaless-gas-phase etches (several HF s olutions, H3PO4, HNO3 + H2O + NH4F, KOH, Type A aluminum etchant, H2O + H2O2 + HF, H2O2, piranha, acetone, HF vapor, XeF2, and various combi nations of SF6, CF4, CHF3, Cl-2, O-2, N-2, and He in plasmas) were mea sured and are tabulated, Etch preparation, use, and chemical reactions (from the technical literature) are given. Sample preparation and MEM S applications are described for the materials.