AN EELS STUDY OF THE EFFECT OF 2 KEV AR-60 FILMS( ION IRRADIATION ON THIN C)

The ion beam (2 keV Ar) induced amorphization of thin fullerene films has been studied by in situ electron energy loss spectroscopy. The dim inution of the intensity of characteristic peaks in the EELS spectrum was used to deduce a cross section for the destruction of the C-60 mol ecules of (0.82 +/- 0.2) X 10(-14) cm(2). The cross section is somewha t smaller than that expected using scaling arguments from the results of more energetic ion bombardment (100-300 keV). The differences are i nterpreted in terms the secondary processes which occur within the col lision cascade surrounding the ion as it slows down in the solid.