Two applications of angular dependent XPS (X-ray photoelectron spectro
scopy) experiments, performed with a Perkin Elmer Phi 5500 ESCA system
in the framework of a monolayer catalyst research project, are illust
rated. XPFS (X-ray photoelectron forward scattering) measurements were
used to show the oxygen removal at the surface of catalytically reduc
ed V2O5(001) pellets, in comparison with pure V2O5. ARXPS (angle resol
ved XPS) polar scans were taken from a model catalyst system (TiO2 ana
tase supported V2O5 layers) in order to determine their components and
the chemical state of the system. With the use of the statistical tec
hnique MLCFA (maximum likelihood common factor analysis), different ov
erlapping components in the V and Ti photoemission peaks were separate
d, pointing towards the existence of a V-Ti-O bonding at the V2O5/TIO2
interface.