Ma. Pariselle et al., OPTICAL STUDY OF DEFECTS IN RBI AND KI BOMBARDED WITH HIGH-ENERGY ARGON IONS AT TEMPERATURES BETWEEN 20 K AND 300 K, Radiation effects and defects in solids, 136(1-4), 1995, pp. 1193-1196
RbI and KI crystals have been bombarded with high energy argon ions at
temperatures between 20 K and 300 K followed by an in situ measuremen
t of the optical absorption. The defect inventory at each temperature
has been studied. The efficiency of F centre production in its broad f
eatures follows that observed using X-irradiation; the rate is low at
20 K and rises to a maximum at 200 K followed by a decrease at 300 K.
The 20 K results for RbI also show the relatively small presence of H
centres and di-interstitial halogen aggregates but also significant co
ncentrations of alpha-centres and the complementary I-centres. The res
ults are discussed in the light of the excitonic mechanism and the cur
rent ideas concerning the deposition and dissipation of energy in the
ion tracks. Micro-Raman spectroscopy has been used to study the concen
tration profile of halogen aggregates along the ion tracks in samples
bombarded at 300 K.