OPTICAL STUDY OF DEFECTS IN RBI AND KI BOMBARDED WITH HIGH-ENERGY ARGON IONS AT TEMPERATURES BETWEEN 20 K AND 300 K

Citation
Ma. Pariselle et al., OPTICAL STUDY OF DEFECTS IN RBI AND KI BOMBARDED WITH HIGH-ENERGY ARGON IONS AT TEMPERATURES BETWEEN 20 K AND 300 K, Radiation effects and defects in solids, 136(1-4), 1995, pp. 1193-1196
Citations number
6
Categorie Soggetti
Physics, Condensed Matter","Nuclear Sciences & Tecnology
ISSN journal
10420150
Volume
136
Issue
1-4
Year of publication
1995
Pages
1193 - 1196
Database
ISI
SICI code
1042-0150(1995)136:1-4<1193:OSODIR>2.0.ZU;2-A
Abstract
RbI and KI crystals have been bombarded with high energy argon ions at temperatures between 20 K and 300 K followed by an in situ measuremen t of the optical absorption. The defect inventory at each temperature has been studied. The efficiency of F centre production in its broad f eatures follows that observed using X-irradiation; the rate is low at 20 K and rises to a maximum at 200 K followed by a decrease at 300 K. The 20 K results for RbI also show the relatively small presence of H centres and di-interstitial halogen aggregates but also significant co ncentrations of alpha-centres and the complementary I-centres. The res ults are discussed in the light of the excitonic mechanism and the cur rent ideas concerning the deposition and dissipation of energy in the ion tracks. Micro-Raman spectroscopy has been used to study the concen tration profile of halogen aggregates along the ion tracks in samples bombarded at 300 K.