K. Bluthner et al., FABRICATION AND CHARACTERIZATION OF SINGLE-ELECTRON TRANSISTORS BASEDON AL ALOX/AL AND NB/ALOX/NB TUNNEL-JUNCTIONS/, Journal de physique. IV, 6(C3), 1996, pp. 163-167
The SAIL (self-aligned in-line) technique has been applied to the prep
aration of ultrasmall metallic tunnel junctions. By using e-beam litho
graphy and sputter methods the area of both Al/AlOx/Al and Nb/AlOx/Nb
contacts has so far been reduced to less than 0.005 mu m(2). At low te
mperatures high-ohmic double junctions with a small metallic island in
between show the Coulomb blockade effect. The current through such a
device can be modulated by a voltage applied to a gate electrode capac
itively coupled to the island (single-electron transistor). Both these
single-charge phenomena have been observed at temperatures of a few h
undred mK.