FABRICATION AND CHARACTERIZATION OF SINGLE-ELECTRON TRANSISTORS BASEDON AL ALOX/AL AND NB/ALOX/NB TUNNEL-JUNCTIONS/

Citation
K. Bluthner et al., FABRICATION AND CHARACTERIZATION OF SINGLE-ELECTRON TRANSISTORS BASEDON AL ALOX/AL AND NB/ALOX/NB TUNNEL-JUNCTIONS/, Journal de physique. IV, 6(C3), 1996, pp. 163-167
Citations number
9
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
6
Issue
C3
Year of publication
1996
Pages
163 - 167
Database
ISI
SICI code
1155-4339(1996)6:C3<163:FACOST>2.0.ZU;2-Z
Abstract
The SAIL (self-aligned in-line) technique has been applied to the prep aration of ultrasmall metallic tunnel junctions. By using e-beam litho graphy and sputter methods the area of both Al/AlOx/Al and Nb/AlOx/Nb contacts has so far been reduced to less than 0.005 mu m(2). At low te mperatures high-ohmic double junctions with a small metallic island in between show the Coulomb blockade effect. The current through such a device can be modulated by a voltage applied to a gate electrode capac itively coupled to the island (single-electron transistor). Both these single-charge phenomena have been observed at temperatures of a few h undred mK.