PERPENDICULAR MAGNETORESISTANCE IN CO CU MULTILAYERED NANOWIRES/

We have carried out magnetoresistance measurements in the CPP (current perpendicular to the planes) geometry of electrodeposited Co/Cu multi layered nanowires with Cu and Co layer thicknesses varying over wide r anges. The data are compared with the results of the Valet-Fert model for perpendicular transport. The observed behaviour agrees with the co rresponding predictions in various limits of the layers thicknesses. T he interface and bulk spin-dependent scattering parameters as well as the spin diffusion lengths in the nonmagnetic and ferromagnetic layers are extracted from this analysis.