THE STUDY OF SELF-DIFFUSION IN CRYSTALLINE AND AMORPHOUS MULTILAYER SAMPLES BY NEUTRON REFLECTOMETRY

Citation
J. Speakman et al., THE STUDY OF SELF-DIFFUSION IN CRYSTALLINE AND AMORPHOUS MULTILAYER SAMPLES BY NEUTRON REFLECTOMETRY, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 411-412
Citations number
2
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
03048853
Volume
156
Issue
1-3
Year of publication
1996
Pages
411 - 412
Database
ISI
SICI code
0304-8853(1996)156:1-3<411:TSOSIC>2.0.ZU;2-X
Abstract
Real time, in-situ, annealing experiments on the CRISP reflectometer a t ISlS neutron source, RAL, Chilton, have been made to measure the sel f diffusion of nickel in special isotope-enriched polycrystalline Ni-n at:Ni-62 multilayers and in amorphous a-(Ni55Zr45)-Ni-62: a-(Ni55Zr45) -Ni-nat multilayers where grain boundary diffusion is absent.