J. Speakman et al., THE STUDY OF SELF-DIFFUSION IN CRYSTALLINE AND AMORPHOUS MULTILAYER SAMPLES BY NEUTRON REFLECTOMETRY, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 411-412
Real time, in-situ, annealing experiments on the CRISP reflectometer a
t ISlS neutron source, RAL, Chilton, have been made to measure the sel
f diffusion of nickel in special isotope-enriched polycrystalline Ni-n
at:Ni-62 multilayers and in amorphous a-(Ni55Zr45)-Ni-62: a-(Ni55Zr45)
-Ni-nat multilayers where grain boundary diffusion is absent.