REMOTE INDUCTIVE EFFECTS IN THE SI 2P SPECTRA OF HALOGENATED SILICON

Si 2p spectra collected from fluorinated Si(111)-7 x 7 are analyzed to determine whether chemical shifts induced by remote F atoms are disce rnible. Although the traditional interpretation adequately accounts fo r the observed chemical shifts without considering remotely induced sh ifts, recent experimental evidence indicates that such shifts may occu r for highly electronegative adsorbates. Thus, an extended scheme is o utlined that is consistent with all known data, but which includes rem otely induced shifts. It is found that, although they differ quantitat ively, both approaches yield the same qualitative results for fluorina ted Si.