DEPTH PROFILE DETERMINATION OF EXTREMELY DILUTED POLARIZED IONS IMPLANTED IN METALS

Authors
CYAMUKUNGU M NEYENS G
Citation
M. Cyamukungu et G. Neyens, DEPTH PROFILE DETERMINATION OF EXTREMELY DILUTED POLARIZED IONS IMPLANTED IN METALS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 111(3-4), 1996, pp. 341-343
Citations number
8
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
111
Issue
3-4
Year of publication
1996
Pages
341 - 343
Database
ISI
SICI code
0168-583X(1996)111:3-4<341:DPDOED>2.0.ZU;2-K
Abstract
A direct method for the determination of the depth profile of implante d polarized probes is described. It has been applied to measure the de pth profile of B-12 nuclei implanted at an atomic concentration of 10( -16) in polycrystalline gold. The results prove the ability of this me thod to measure the depth distribution of implanted nuclei with an unk nown energy distribution, which is typical for a polarized beam emergi ng from a succession of nuclear reactions or electromagnetic interacti ons.