DIODE-LASER SPECTROSCOPY - PRECISE SPECTRAL-LINE SHAPE MEASUREMENTS

When one speaks about modern trends in tunable diode laser spectroscop y (TDLS) one should mention that precise line shape measurements have become one of the most promising applications of diode lasers in high resolution molecular spectroscopy. Accuracy limitations of TDL spectro meters are considered in this paper, proving the ability to measure sp ectral line profile with precision better than 1%. A four parameter Vo igt profile is used to fit the experimental spectrum, and the possibil ity of line shift measurements with an accuracy of 2 x 10(-5) cm(-1) i s shown. Test experiments demonstrate the error line intensity ratios to be less than 0.3% for the proposed approach. Differences between '' soft'' and ''hard'' models of line shape have been observed experiment ally for the first time. Some observed resonance effects are considere d with respect to collision adiabacity.