Vr. Vosberg et al., STRESS MEASUREMENT IN ALUMINA SCALES ON HIGH-TEMPERATURE ALLOYS USINGX-RAY STRESS EVALUATION AND LASER RAMAN-SPECTROSCOPY, Fresenius' journal of analytical chemistry, 355(5-6), 1996, pp. 745-747
The effect of silicon and titanium on the spallation resistance of alu
mina scales grown on NiCrAlY-type alloys has been investigated using m
odel alloys with different additions of Si or Ti. For this purpose cyc
lic oxidation experiments have been carried out at temperatures betwee
n 950 and 1100 degrees C. After various times stresses in selected Si-
doped samples have been determined by Xray stress evaluation (XSE) at
ambient temperature. The compressive stresses in the scales have been
found to increase with an increasing oxidation time tending to become
constant for long times. The development of stress is affected by the
presence of Si. Laser Raman spectroscopy (LRS) has been calibrated for
strain measurement using XSE results. Then LRS has been applied for s
train measurement at higher temperatures.