USE OF PIXE MEASUREMENTS PERFORMED AT DIFFERENT PROTON ENERGIES TO CALCULATE MATRIX CORRECTION FOR INFINITELY THICK TARGETS (TTPIXE) WITHINTHE FRAMEWORK OF THE ALPHA-PARAMETER METHOD

The correction method for PIXE data described previously is based on t he experimental determination of an alpha parameter linking two indepe ndent phenomena: X-ray absorption and proton energy loss. Using the al pha parameters, corrections can be calculated without making any hypot hesis about the matrix composition. Among other possibilities, the alp ha parameters can be obtained from two PIXE measurements performed in the same geometrical conditions at two proton energies on a thick targ et (TTPIXE). General tables allowing an easy use of the method are giv en. The precision of the method is tested using reference materials.