K. Morito et al., A GUIDING PRINCIPLE TO SELECT PIXE OR PIXE-INDUCED XRF FOR STEEL ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 569-572
The signal-to-background ratio (S/B) and the minimum detection limit (
M.D.L.) of 0.41 wt.% Mn in a typical steel was determined experimental
ly and those of Cr, V and Ti (0.41 wt.% each) in hypothetical steels w
ere estimated theoretically by using the above experimental values. Th
ese S/B and M.D.L. values were compared for three kinds of methods, i.
e. PIXE without Cr absorber, PIXE with Cr absorber and PIXE-induced XR
F under the same experimental conditions. Here 4000 s and 60 cps were
chosen for the data acquisition time and the X-ray counting rates resp
ectively. PIXE-induced XRF was excellent among these methods in both S
/B and M.D.L, for several times or more.