A GUIDING PRINCIPLE TO SELECT PIXE OR PIXE-INDUCED XRF FOR STEEL ANALYSIS

Citation
K. Morito et al., A GUIDING PRINCIPLE TO SELECT PIXE OR PIXE-INDUCED XRF FOR STEEL ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 569-572
Citations number
9
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
109
Year of publication
1996
Pages
569 - 572
Database
ISI
SICI code
0168-583X(1996)109:<569:AGPTSP>2.0.ZU;2-J
Abstract
The signal-to-background ratio (S/B) and the minimum detection limit ( M.D.L.) of 0.41 wt.% Mn in a typical steel was determined experimental ly and those of Cr, V and Ti (0.41 wt.% each) in hypothetical steels w ere estimated theoretically by using the above experimental values. Th ese S/B and M.D.L. values were compared for three kinds of methods, i. e. PIXE without Cr absorber, PIXE with Cr absorber and PIXE-induced XR F under the same experimental conditions. Here 4000 s and 60 cps were chosen for the data acquisition time and the X-ray counting rates resp ectively. PIXE-induced XRF was excellent among these methods in both S /B and M.D.L, for several times or more.